Unlock Cleanroom Excellence

Application Note:
pdf-thumbnail-cleanliness-in-electronics-manufacturingMonitoring Cleanliness in Electronics Manufacturing with Dynamic Image Analysis

Maintaining contamination-free environments is critical for producing high-quality electronic and optical components. Even the smallest particles can compromise product performance and reliability. To tackle this challenge, our latest application note explores Dynamic Image Analysis (DIA), also referred to as Flow Imaging Microscopy (FIM)—an advanced imaging-based solution for monitoring and identifying contaminants in cleanrooms and manufacturing processes.

Why It Matters:

  • Improve Product Reliability: Identify and reduce contamination risks.
  • Accelerate Problem Solving: Pinpoint contamination sources rapidly.
  • Enhance Compliance: Meet rigorous cleanliness standards like ISO 16232 and IEST-STD-CC1246.

Inside the Application Note:

  • Comparison of DIA vs. Traditional Particle Counting techniques.
  • Real-world insights: Case study on contamination control using FlowCam instruments.
  • Step-by-step exploration of how DIA can analyze particle size, shape, and type with precision.

Key Benefits of FlowCam Technology:

  • Direct Imaging & Rapid Analysis: Process up to millions of particles in minutes.
  • Detailed Morphology: Go beyond size—identify fibers, metals, plastics, and more.
  • Flexible Applications: Suitable for monitoring a wide range of contaminants in diverse environments.

Ready to elevate your contamination control and optimize manufacturing processes?

Complete the form to the right to download now!

 

Download Application Note